KARAKTERISASI DAN SIMULASI DIODA PN MEMPERGUNAKAN ALAT UJI OTOMATIS BERBASIS MIKROKONTROLER ATMEGA8A
Abstract: An automated test
platform for I-U curve diode characterisation based on microcontroller of
Atmega8A is presented. Four types of diodes; 1N4007, 1N5401, 1N5392, and 1N4148
were characterized at temperature 303K using step voltage (dU) of 1mV, 5mV,
10mV, 20mV, 50mV, 100mV, and 500mv respectively. The temperature influences on
diode was observed by putting diodes in adiabatic temperature chamber at three
different temperatures of 313K, 323K, and 333K, the I-U curve of diodes are
then measured. The results show an exponentially diodes I-U curve at quadrant I
(forward bias region). For diode parameters, the I-U curve were then modeled
and simulated after diodes equation and resulted an maximum absolute error
10.57% of full scale measurement.
Penulis: Dian Putri Oktavia,
Yanuar Hamzah, Rahmondia N.S, Lazuardi Umar
Kode Jurnal: jpfisikadd160470
